Mourad Oualli, Christian Dua, O. Patard, P. Altuntas, S. Piotrowicz, Piero Gamarra, C. Lacam, J.-C. Jacquet, L. Teisseire, D. Lancereau, E. Chartier, C. Potier, Sylvain L. Delage. Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. Microelectronics Reliability, 88:418-422, 2018. [doi]
Abstract is missing.