Yiming Ouyang, Lizhu Hu, Yifeng Wu, Jianfeng Yang, Kun Xing. Dynamic Fine-Grain Power Gating Design in WiNoC. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 139-148, IEEE, 2018. [doi]
@inproceedings{OuyangHWYX18,
title = {Dynamic Fine-Grain Power Gating Design in WiNoC},
author = {Yiming Ouyang and Lizhu Hu and Yifeng Wu and Jianfeng Yang and Kun Xing},
year = {2018},
doi = {10.1109/ATS.2018.00036},
url = {https://doi.org/10.1109/ATS.2018.00036},
researchr = {https://researchr.org/publication/OuyangHWYX18},
cites = {0},
citedby = {0},
pages = {139-148},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}