Adeboye Stephen Oyeniran, Maksim Jenihhin, Jaan Raik, Raimund Ubar. High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2022, Nicosia, Cyprus, July 4-6, 2022. pages 32-37, IEEE, 2022. [doi]
Abstract is missing.