High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors - researchr publication authors

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Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik. High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]

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