Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik. High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{OyeniranUJGR19-0,
title = {High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors},
author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem Gürsoy and Jaan Raik},
year = {2019},
doi = {10.1109/ETS.2019.8791526},
url = {https://doi.org/10.1109/ETS.2019.8791526},
researchr = {https://researchr.org/publication/OyeniranUJGR19-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1173-5},
}