Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik. Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors. In 23rd Euromicro Conference on Digital System Design, DSD 2020, Kranj, Slovenia, August 26-28, 2020. pages 646-650, IEEE, 2020. [doi]
Abstract is missing.