K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto. Novel Optical Probing System for Quarter-micron VLSI Circuits. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 208-213, IEEE Computer Society, 1997. [doi]
Abstract is missing.