Sule Ozev, Alex Orailoglu. Low-Cost Test for Large Analog IC s. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 101, IEEE Computer Society, 1999. [doi]
Abstract is missing.