Dicle Ozis, Terri S. Fiez, Kartikeya Mayaram. A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes. In Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, CICC 2002, Orlando, FL, USA, May 12-15, 2002. pages 497-500, IEEE, 2002. [doi]
Abstract is missing.