Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo. Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories. IEEE T. Instrumentation and Measurement, 57(2):364-368, 2008. [doi]
@article{PaceGCL08,
title = {Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories},
author = {Calogero Pace and Gino Giusi and Felice Crupi and Salvatore Lombardo},
year = {2008},
doi = {10.1109/TIM.2007.909469},
url = {http://dx.doi.org/10.1109/TIM.2007.909469},
tags = {classification},
researchr = {https://researchr.org/publication/PaceGCL08},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {57},
number = {2},
pages = {364-368},
}