Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories

Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo. Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories. IEEE T. Instrumentation and Measurement, 57(2):364-368, 2008. [doi]

Abstract

Abstract is missing.