Andrea Padovani, Milan Pesic, Federico Nardi, Valerio Milo, Luca Larcher, Mondol Anik Kumar, Zunaid Baten. Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited). In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]
Abstract is missing.