The Risks of Low Level Narrow Artificial Intelligence

John Page, Michael Bain, Faqihza Mukhlish. The Risks of Low Level Narrow Artificial Intelligence. In IEEE International Conference on Intelligence and Safety for Robotics, ISR 2018, Shenyang, China, August 24-27, 2018. pages 1-6, IEEE, 2018. [doi]

Authors

John Page

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Michael Bain

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Faqihza Mukhlish

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