John Page, Michael Bain, Faqihza Mukhlish. The Risks of Low Level Narrow Artificial Intelligence. In IEEE International Conference on Intelligence and Safety for Robotics, ISR 2018, Shenyang, China, August 24-27, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{PageBM18,
title = {The Risks of Low Level Narrow Artificial Intelligence},
author = {John Page and Michael Bain and Faqihza Mukhlish},
year = {2018},
doi = {10.1109/IISR.2018.8535903},
url = {https://doi.org/10.1109/IISR.2018.8535903},
researchr = {https://researchr.org/publication/PageBM18},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Conference on Intelligence and Safety for Robotics, ISR 2018, Shenyang, China, August 24-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5547-4},
}