Samuel N. Pagliarini, Tian Ban, Lirida A. B. Naviner, Jean-François Naviner. Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 113-116, IEEE, 2013. [doi]
Abstract is missing.