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On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs

Dario Pagnano, Giorgia Longobardi, Florin Udrea, Jinming Sun, Mohamed Imam, Reenu Garg, Hyeongnam Kim, Alain Charles. On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs. Microelectronics Reliability, 88:610-614, 2018. [doi]

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Dario Pagnano

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Giorgia Longobardi

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Florin Udrea

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Jinming Sun

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Mohamed Imam

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Reenu Garg

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Hyeongnam Kim

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Alain Charles

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