Dario Pagnano, Giorgia Longobardi, Florin Udrea, Jinming Sun, Mohamed Imam, Reenu Garg, Hyeongnam Kim, Alain Charles. On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs. Microelectronics Reliability, 88:610-614, 2018. [doi]
Abstract is missing.