Girish Pahwa, Ayushi Sharma, Ravi Goel, Garima Gill, Harshit Agarwal, Yogesh Singh Chauhan, Chenming Hu. Robust Compact Model of High-Voltage MOSFET's Drift Region. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(1):337-340, 2023. [doi]
Abstract is missing.