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On the Resiliency of NCFET Circuits Against Voltage Over-Scaling

Guilherme Paim, Georgios Zervakis, Girish Pahwa, Yogesh Singh Chauhan, Eduardo Antonio Cesar da Costa, Sergio Bampi, Jörg Henkel, Hussam Amrouch. On the Resiliency of NCFET Circuits Against Voltage Over-Scaling. IEEE Trans. Circuits Syst. I Regul. Pap., 68(4):1481-1492, 2021. [doi]

Authors

Guilherme Paim

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Georgios Zervakis

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Girish Pahwa

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Yogesh Singh Chauhan

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Eduardo Antonio Cesar da Costa

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Sergio Bampi

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Jörg Henkel

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Hussam Amrouch

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