Guilherme Paim, Georgios Zervakis, Girish Pahwa, Yogesh Singh Chauhan, Eduardo Antonio Cesar da Costa, Sergio Bampi, Jörg Henkel, Hussam Amrouch. On the Resiliency of NCFET Circuits Against Voltage Over-Scaling. IEEE Trans. Circuits Syst. I Regul. Pap., 68(4):1481-1492, 2021. [doi]
@article{PaimZPCCBHA21,
title = {On the Resiliency of NCFET Circuits Against Voltage Over-Scaling},
author = {Guilherme Paim and Georgios Zervakis and Girish Pahwa and Yogesh Singh Chauhan and Eduardo Antonio Cesar da Costa and Sergio Bampi and Jörg Henkel and Hussam Amrouch},
year = {2021},
doi = {10.1109/TCSI.2021.3058451},
url = {https://doi.org/10.1109/TCSI.2021.3058451},
researchr = {https://researchr.org/publication/PaimZPCCBHA21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
volume = {68},
number = {4},
pages = {1481-1492},
}