Guilherme Paim, Georgios Zervakis, Girish Pahwa, Yogesh Singh Chauhan, Eduardo Antonio Cesar da Costa, Sergio Bampi, Jörg Henkel, Hussam Amrouch. On the Resiliency of NCFET Circuits Against Voltage Over-Scaling. IEEE Trans. Circuits Syst. I Regul. Pap., 68(4):1481-1492, 2021. [doi]
Abstract is missing.