Krishna V. Palem, Avinash Lingamneni, Christian C. Enz, Christian Piguet. Why design reliable chips when faulty ones are even better. In ESSCIRC 2013 - Proceedings of the 39th European Solid-State Circuits Conference, Bucharest, Romania, September 16-20, 2013. pages 255-258, IEEE, 2013. [doi]
Abstract is missing.