Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor E. Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis. A Placement-Aware Soft Error Rate Estimation of Combinational Circuits for Multiple Transient Faults in CMOS Technology. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.