Impact of steep-slope transistors on non-von Neumann architectures: CNN case study - researchr publication authors

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Indranil Palit, Behnam Sedighi, Andras Horvath, Xiaobo Sharon Hu, Joseph Nahas, Michael T. Niemier. Impact of steep-slope transistors on non-von Neumann architectures: CNN case study. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

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