Impact of steep-slope transistors on non-von Neumann architectures: CNN case study

Indranil Palit, Behnam Sedighi, Andras Horvath, Xiaobo Sharon Hu, Joseph Nahas, Michael T. Niemier. Impact of steep-slope transistors on non-von Neumann architectures: CNN case study. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

@inproceedings{PalitSHHNN14,
  title = {Impact of steep-slope transistors on non-von Neumann architectures: CNN case study},
  author = {Indranil Palit and Behnam Sedighi and Andras Horvath and Xiaobo Sharon Hu and Joseph Nahas and Michael T. Niemier},
  year = {2014},
  doi = {10.7873/DATE2014.150},
  url = {http://dx.doi.org/10.7873/DATE2014.150},
  researchr = {https://researchr.org/publication/PalitSHHNN14},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014},
  publisher = {IEEE},
}