Improving yield and reliability of chip multiprocessors

Abhisek Pan, Omer Khan, Sandip Kundu. Improving yield and reliability of chip multiprocessors. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 490-495, IEEE, 2009. [doi]

Authors

Abhisek Pan

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Omer Khan

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Sandip Kundu

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