Abhisek Pan, Omer Khan, Sandip Kundu. Improving yield and reliability of chip multiprocessors. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 490-495, IEEE, 2009. [doi]
@inproceedings{PanKK09,
title = {Improving yield and reliability of chip multiprocessors},
author = {Abhisek Pan and Omer Khan and Sandip Kundu},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090714&count=326&index=100},
tags = {reliability},
researchr = {https://researchr.org/publication/PanKK09},
cites = {0},
citedby = {0},
pages = {490-495},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}