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ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques

YuQian Pan, Zhaojun Lu, Haichun Zhang, Haoming Zhang, Md Tanvir Arafin, Zhenglin Liu, Gang Qu 0001. ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques. IEEE Transactions on Computers, 72(6):1525-1538, June 2023. [doi]

Authors

YuQian Pan

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Zhaojun Lu

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Haichun Zhang

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Haoming Zhang

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Md Tanvir Arafin

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Zhenglin Liu

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Gang Qu 0001

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