YuQian Pan, Zhaojun Lu, Haichun Zhang, Haoming Zhang, Md Tanvir Arafin, Zhenglin Liu, Gang Qu 0001. ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques. IEEE Transactions on Computers, 72(6):1525-1538, June 2023. [doi]
@article{PanLZZALQ23,
title = {ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques},
author = {YuQian Pan and Zhaojun Lu and Haichun Zhang and Haoming Zhang and Md Tanvir Arafin and Zhenglin Liu and Gang Qu 0001},
year = {2023},
month = {June},
doi = {10.1109/TC.2022.3214115},
url = {https://doi.org/10.1109/TC.2022.3214115},
researchr = {https://researchr.org/publication/PanLZZALQ23},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {72},
number = {6},
pages = {1525-1538},
}