YuQian Pan, Zhaojun Lu, Haichun Zhang, Haoming Zhang, Md Tanvir Arafin, Zhenglin Liu, Gang Qu 0001. ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques. IEEE Transactions on Computers, 72(6):1525-1538, June 2023. [doi]
Abstract is missing.