Test Generation using Reinforcement Learning for Delay-based Side-Channel Analysis

Zhixin Pan, Jennifer Sheldon, Prabhat Mishra. Test Generation using Reinforcement Learning for Delay-based Side-Channel Analysis. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2020, San Diego, CA, USA, November 2-5, 2020. pages 1-7, IEEE, 2020. [doi]

Abstract

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