180nm 4Mb High Speed High Reliability Embedded SONOS Flash Memory

Liyang Pan, Dong Wu, Guangjun Yang, Lei Sun, Huiqing Pang, Jun Zhu. 180nm 4Mb High Speed High Reliability Embedded SONOS Flash Memory. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 305-308, IEEE, 2006. [doi]

Abstract

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