Black-Box Test-Cost Reduction Based on Bayesian Network Models - researchr publication authors

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Renjian Pan, Zhaobo Zhang, Xin Li 0001, Krishnendu Chakrabarty, Xinli Gu. Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(2):386-399, 2021. [doi]

This author has not been identified. Look up 'Renjian Pan' in GoogleThis author has not been identified. Look up 'Zhaobo Zhang' in GoogleThis author has not been identified. Look up 'Xin Li 0001' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in GoogleThis author has not been identified. Look up 'Xinli Gu' in Google

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