Black-Box Test-Cost Reduction Based on Bayesian Network Models

Renjian Pan, Zhaobo Zhang, Xin Li 0001, Krishnendu Chakrabarty, Xinli Gu. Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(2):386-399, 2021. [doi]

Abstract

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