Rajiv Pandey, Dan Higgins. probe card-a solution for at-speed, high density, wafer probing. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 836-842, IEEE Computer Society, 1998. [doi]
@inproceedings{PandeyH98,
title = {probe card-a solution for at-speed, high density, wafer probing},
author = {Rajiv Pandey and Dan Higgins},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930836abs.htm},
researchr = {https://researchr.org/publication/PandeyH98},
cites = {0},
citedby = {0},
pages = {836-842},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}