Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee. SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]
Abstract is missing.