Liang-Teck Pang, Borivoje Nikolic. Measurement and analysis of variability in 45nm strained-Si CMOS technology. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 129-132, IEEE, 2008. [doi]
Abstract is missing.