Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology

Liang-Teck Pang, Kun Qian, Costas J. Spanos, Borivoje Nikolic. Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology. J. Solid-State Circuits, 44(8):2233-2243, 2009. [doi]

Abstract

Abstract is missing.