An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated

Liang Pang, Ziqi Wang, Rui Shi, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi. An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. Integration, 89:155-167, March 2023. [doi]

Authors

Liang Pang

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Ziqi Wang

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Rui Shi

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Mengyun Yao

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Xiao Shi

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Hao Yan

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Longxin Shi

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