Liang Pang, Ziqi Wang, Rui Shi, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi. An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. Integration, 89:155-167, March 2023. [doi]
@article{PangWSYSYS23,
title = {An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated},
author = {Liang Pang and Ziqi Wang and Rui Shi and Mengyun Yao and Xiao Shi and Hao Yan and Longxin Shi},
year = {2023},
month = {March},
doi = {10.1016/j.vlsi.2022.11.015},
url = {https://doi.org/10.1016/j.vlsi.2022.11.015},
researchr = {https://researchr.org/publication/PangWSYSYS23},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {89},
pages = {155-167},
}