Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application - researchr publication

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Pankaj Pant, Abhijit Chatterjee. Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 245-252, IEEE Computer Society, 2000.

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