Pankaj Pant, Joshua Zelman. Understanding Power Supply Droop during At-Speed Scan Testing. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 227-232, IEEE Computer Society, 2009. [doi]
@inproceedings{PantZ09-0,
title = {Understanding Power Supply Droop during At-Speed Scan Testing},
author = {Pankaj Pant and Joshua Zelman},
year = {2009},
doi = {10.1109/VTS.2009.46},
url = {http://dx.doi.org/10.1109/VTS.2009.46},
tags = {testing},
researchr = {https://researchr.org/publication/PantZ09-0},
cites = {0},
citedby = {0},
pages = {227-232},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}