Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Pankaj Pant, Joshua Zelman. Understanding Power Supply Droop during At-Speed Scan Testing. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 227-232, IEEE Computer Society, 2009. [doi]
Abstract is missing.