Nikolaos Papandreou, Nikolas Ioannou, Thomas P. Parnell, Roman A. Pletka, Milos Stanisavljevic, Radu Stoica, Sasa Tomic, Haralampos Pozidis. Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect. In 19th Non-Volatile Memory Technology Symposium, NVMTS 2019, Durham, NC, USA, October 28-30, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.