Nikolaos Papandreou, Haralampos Pozidis, Nikolas Ioannou, Thomas P. Parnell, Roman A. Pletka, Milos Stanisavljevic, Radu Stoica, Sasa Tomic, Patrick Breen, Gary A. Tressler, Aaron Fry, Timothy Fisher, Andrew Walls. Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.