Nikolaos Papandreou, Haralampos Pozidis, Thomas P. Parnell, Nikolas Ioannou, Roman A. Pletka, Sasa Tomic, Patrick Breen, Gary A. Tressler, Aaron Fry, Timothy Fisher. Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.