Antonis Papanikolaou, Hua Wang, Miguel Miranda, Francky Catthoor, Wim Dehaene. Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System Design. In Giovanni De Micheli, Salvador Mir, Ricardo Reis, editors, VLSI-SoC: Research Trends in VLSI and Systems on Chip - Fourteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC2006), October 16-18, 2006, Nice, France. Volume 249 of IFIP, pages 119-141, Springer, 2006. [doi]
Abstract is missing.