Radiation Hardened and Self-Recoverable Latch Design for Quad-Node Upset Mitigation - researchr publication

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Evangelos Paparsenos, Yiorgos Tsiatouhas. Radiation Hardened and Self-Recoverable Latch Design for Quad-Node Upset Mitigation. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-4, IEEE, 2026. [doi]

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