Martin Pape, Defne Milen Gueler, Ferdinand Waßelewsky, Tom Wolf. Unsupervised Defect Clustering From Optical One-Class Anomaly Detection. In 30th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2025, Porto, Portugal, September 9-12, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.