Innovative practices session 2C: "How is industry simplifying analog test"

Rubin A. Parekhji, Srinivas Modekurty. Innovative practices session 2C: "How is industry simplifying analog test". In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1, IEEE, 2017. [doi]

Authors

Rubin A. Parekhji

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Srinivas Modekurty

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